Advanced Materials Characterization

​In the four course Advanced Materials Characterization Certificate (AMCC) students will explore techniques for characterizing and analyzing the atomic-through-mesoscale structure of materials and their surfaces. Students will learn the fundamental principles and limitations of a range of techniques, to prepare samples, and to operate state-of-the-art equipment. The program provides direct, hands-on experiences to both on-campus and distance learning participants by leveraging internet-based remote operation of characterization equipment in the UK Electron Microscopy Center. 

Students will study and work with: 
 

• Scanning Electron Microscope with integrated Focused Ion Beam (FIB/SEM, Helios Nanolab 660/G3 from ThermoFisher Scientific)  
   

• Surface imaging techniques, elemental analysis, and crystal orientation and texture analysis via Energy Dispersive Spectroscopy (EDS) and Electron Back Scatter Diffraction (EBSD) (Oxford Instruments), and Electron Energy Loss Spectroscopy (EELS) 
   

• TEM (Talos F200X, ThermoFisher Scientific) offering ultra-high-resolution imaging capabilities, coupled with advanced analytical techniques  
   

• Nanoscale cross-sectioning and FIB milling for TEM sample preparation  
   

• X-Ray Photoelectron Spectroscopy (XPS, K-Alpha system from ThermoFisher Scientific)